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ParticleView Technology

Available from METTLER TOLEDO

PVM® technology is a probe-based instrument that visualizes particles and particle mechanisms in real time. High-resolution images are continuously captured under a wide range of process conditions without the need for sampling or manual offline analysis. A process trend, sensitive to changes in particle size and concentration, is automatically combined with the most relevant images providing scientists with a straightforward and reliable method to ensure comprehensive process understanding is acquired with every experiment.

ParticleView real-time microscopy is an easy-to-use PAT tool that records high resolution images of particles and particle structures as they naturally exist in process. Each image is analyzed in real time providing a simple trend that follows particle size, count and shape under real process conditions.

With ParticleView, scientists observe particles as they form, grow, break and change shape, obtaining insight into the hidden mechanisms that control their process.

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