AFM-Raman and Nano-Raman (TERS)

HORIBA’s Raman technology is easily coupled to scanning probe microscopes (SPM). Our fully integrated solution uses directly coupled optics optimized for high-throughput. The platform allows Atomic Force Microscopy (AFM), near-field optical techniques (SNOM, NSOM), Scanning Tunneling Microscopy (STM) and confocal optical spectroscopy (Raman and fluorescence imaging) in one versatile instrument, ready for Tip-Enhanced Raman Spectroscopy (TERS) or co-localized measurements.

HORIBA partners with most leading manufacturers, including AIST-NT, Agilent Technologies, Asylum Research, Bruker Nano (formerly Veeco Instruments), JPK Instruments, Nanonics Imaging Ltd, and Park Systems