EX-6600 ED-XRF Spectrometer

Product Overview

The combination of Silicon Drift Detection Technology and secondary targets allow for the highest degree of sensitivity so that precise and efficient analysis can be made. In addition, the systems sample changer enhances the efficiency that the EX-6600 SDD can provide the user.

The EX-6600 SDD system has been developed by Xenemetrix Inc, a leader in ED-XRF development, for general laboratory analysis and geological testing interests. It is offered by the North American Sales Agent, Eastern Applied Research Inc.

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