Ztherm Modulated Thermal Analysis for Asylum Research AFMs
Available from Asylum Research
Ztherm™ Modulated Thermal Analysis Option For Asylum Research AFMs
Ztherm combines powerful conventional and new advanced thermal analysis capabilities with the high resolution of AFM, and adds patent pending compensation for thermally-induced cantilever bending and measurement of contact stiffness and dissipation for the highest sensitivity and resolution available. The Ztherm Option provides highly localized heating with sensitivity to ≤10-22 liter (sub-zeptoliter) materials property changes, more than an order of magnitude improvement in volume over that previously available with commercial systems. The Ztherm Option is available for the Asylum Research MFP-3D™ and Cypher™ AFM Systems.
Cantilever Compensation and Control
A standing problem with existing AFM-based thermal analysis systems is thermally induced bending of the cantilever that results in spurious deflection signals and variable loads being applied during heating. Asylum has developed a new cantilever compensation and control solution that corrects this problem, providing constant-load detection of thermally induced melting (Tm), phase transitions (Tg) and other morphological and compliance effects for materials studies and identification – for areas less than 20nm x 20nm
“The recent results I’ve seen from Asylum’s Ztherm Modulated Thermal Analysis are the highest resolution thermal measurements by anyone to date. Truly impressive!”
William King,University of Illinois, Urbana-Champaign